JEOL NeoScope JCM-7000 Benchtop SEM
Compact, high-resolution SEM for quick, easy sample analysis
The JEOL NeoScope JCM-7000 is a compact, benchtop scanning electron microscope (SEM) designed for easy operation and high-resolution imaging. It features a user-friendly interface, making it ideal for both beginners and experienced users in various research and industrial applications. With its high-performance capabilities, the JCM-7000 provides detailed imaging and analysis of a wide range of samples, including biological specimens, materials, and nanostructures.
JEOL NeoScope JCM-7000 Benchtop SEM Specifications
- Electron Gun: Tungsten filament
- Accelerating Voltage: 0.5 to 30 kV
- Resolution:
- 3.0 nm at 30 kV (SEI mode)
- 10 nm at 30 kV (BSE mode)
- Magnification Range: 10x to 100,000x
- Sample Chamber Size: 150 mm (diameter) × 150 mm (height)
- Maximum Sample Size: 150 mm (diameter) × 30 mm (height)
- Detectors:
- Secondary Electron Detector (SE)
- Backscattered Electron Detector (BSE)
- Working Distance: 8 to 20 mm
- Beam Spot Size: 1.0 to 5.0 nm (variable)
- Vacuum System:
- High Vacuum: 1 × 10⁻⁶ Pa
- Low Vacuum: 10 to 200 Pa (adjustable)
- Display: 15-inch color LCD touchscreen
- Power Supply: 100V, 50/60 Hz, 1.0 kVA
- Weight: Approximately 40 kg (88 lbs)
For further information, it is recommended to reach out to a representative from Nuhsbaum. Our representatives are knowledgeable about the JEOL NeoScope JCM-7000 Benchtop SEM offerings and can provide expert guidance and support in selecting the right configuration to meet specific research needs.
JEOL NeoScope JCM-7000 Bechtop SEM Description
The JEOL NeoScope JCM-7000 is a compact benchtop scanning electron microscope (SEM) designed for easy use and high-quality imaging. It offers an accelerating voltage range of 0.5 to 30 kV, providing flexibility in analyzing various sample types. With a resolution of 3.0 nm at 30 kV in secondary electron imaging mode, it captures detailed surface features. The microscope is equipped with both secondary electron (SE) and backscattered electron (BSE) detectors, allowing for comprehensive imaging and compositional analysis.
It has a wide magnification range from 10x to 100,000x, making it suitable for both low and high magnification imaging. The sample chamber supports samples up to 150 mm in diameter and 30 mm in height, accommodating a broad range of specimens. The user-friendly interface includes a 15-inch color LCD touchscreen, making operation intuitive and minimizing the need for specialized training. With its compact design and a weight of approximately 40 kg, the JCM-7000 is ideal for labs with limited space while offering powerful SEM capabilities for various applications.
For further information, it is recommended to reach out to a representative from Nuhsbaum. Our representatives are knowledgeable about the JEOL NeoScope JCM-7000 Benchtop SEM offerings and can provide expert guidance and support in selecting the right configuration to meet specific research needs.
